Hitachi SU-5000 field emission Scanning Electron Microscope

The Hitachi SU-5000 field emission SEM is a microscope used to observe micron/nano-scale structures (resolution of 0.5 nanometer (10-9 m)). The FESEM is equipped with a deceleration mode for improved imaging and avoiding the effects of charging. The SEM is equipped with a secondary electron detector, backscatter detector and an additional STEM detector