Hitachi HT7700 Transmission Scanning Electron Microscope

Key Functionalities •High-resolution structural and compositional information •High contrast and high-resolution modes •Low energy characterization for beam sensitive samples •STEM capability •User-friendly software command and control Key Configuration Parameters •Fully digital configuration •Easy-to-use software interface •Amber 750k direct electron detector, AMT XR280 camera •Thermionic LaB6 emitter, 0.4-120kV accelerating voltage •Magnification of 50-600,000x •BF/DF STEM capability •High contract/high resolution pole piece with large gap, allowing +/- 70o tilt •STEM unit (brightfield/darkfield)