Hitachi SU3500 Scanning Electron Microscope

Scanning Electron Microscope Hitachi SU3500 Scanning Electron Microscope High resolution imaging, structural and compositional analysis Key Functionalities •High resolution imaging, structural and compositional analysis •Engineered to support analysis of a wide range of samples •Simultaneous imaging with backscattered electron, secondary electron, and ultra variable-pressure (in VP mode) detectors •Variable-pressure operation allows for image observation and analysis of insulators •Energy dispersive x-ray (EDX) analysis and electron backscatter diffraction (EBSD) analysis •Intuitive, user-friendly SEM interface for straightforward operation Key Configuration Parameters •multi-detector configuration; secondary, backscattered, and ultra-variable pressure detectors •Thermionic W emitter •0.3-30 keV accelerating voltage •6-650 Pa variable pressure range