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Bruker Dimension ICON3 Atomic Force Microscope
Bruker Dimension ICON3
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The Icon3® atomic force microscope (AFM) introduces new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry; high performance, multifunctional, scanning probe microscope (SPM) optimized for peak force characterization.
Capabilities
- ✓Housed within an integrated acoustic and vibration isolation enclosure to ensure optimal data collection.
- ✓Motorized stage with a typical X-Y scan range of 90μm x 90μm.
- ✓Various advanced operation modes including: PeakForce Tapping/contacting, Force spectroscopy, Surface potential, Piezoresponse microscopy, Tunneling AFM, etc.
