Princeton University

Location details upon request
Contact Facility Manager

Available Instruments (45)

The VCR IBS/TM200S Ion Beam Sputterer
available
Sample Preparation

The VCR IBS/TM200S Ion Beam Sputterer

VCR • IBS/TM200S

$75.00/hr
Princeton University
0.0(0)
Leica DCM 3D Micro-optical System
available
Optical Microscopy and Spectroscopy

Leica DCM 3D Micro-optical System

Leica • DCM 3D

$75.00/hr
Princeton University
0.0(0)
Horiba Raman Spectrometer
available
Surface Analysis

Horiba Raman Spectrometer

Horiba • Aramis

$75.00/hr
Princeton University
0.0(0)
Nikon AX-R Confocal
available
Microscopy

Nikon AX-R Confocal

Nikon • AX-R

$75.00/hr
Princeton University
0.0(0)
Talos F200X Scanning/Transmission Electron Microscope (S/TEM)
available
Transmission Electron Microscopy (TEM)

Talos F200X Scanning/Transmission Electron Microscope (S/TEM)

FEI • Talos F200X

$75.00/hr
Princeton University
0.0(0)
Allied Multi Prep Polisher
available
Sample Preparation

Allied Multi Prep Polisher

Allied • MultiPrep

$75.00/hr
Princeton University
0.0(0)
RAMÉ-HART Goniometer
available
Surface Analysis

RAMÉ-HART Goniometer

RAMÉ-HART • Model 90

$75.00/hr
Princeton University
0.0(0)
Anton Paar MCR702 Rheometer
available
Thermal Analysis and Rheometry

Anton Paar MCR702 Rheometer

Anton Paar • MCR702

$75.00/hr
Princeton University
0.0(0)
Phosphorescence Fluorescence Lifetime Spectrometer Edinburgh Instruments FLS980
available
Optical Microscopy and Spectroscopy

Phosphorescence Fluorescence Lifetime Spectrometer Edinburgh Instruments FLS980

Edinburgh Instruments • FLS980

$75.00/hr
Princeton University
0.0(0)
Bruker D8 Discover X-Ray Diffractometer
available
XRD, SAXS & 3D X-Ray Microscope

Bruker D8 Discover X-Ray Diffractometer

Bruker • D8 Discover

$75.00/hr
Princeton University
0.0(0)
CreaTec LT STM/nc-AFM
available
Scanning Probe Microscopy (SPM)

CreaTec LT STM/nc-AFM

CreaTec • LT-STM-AFM-CE

$75.00/hr
Princeton University
0.0(0)
Titan Cubed Themis 300 double Cs-corrected Scanning/Transmission Electron Microscope (S/TEM)
available
Transmission Electron Microscopy (TEM)

Titan Cubed Themis 300 double Cs-corrected Scanning/Transmission Electron Microscope (S/TEM)

FEI • Titan Cubed Themis 300

$75.00/hr
Princeton University
0.0(0)
Small-angle X-ray Scattering System (SAXS)
available
XRD, SAXS & 3D X-Ray Microscope

Small-angle X-ray Scattering System (SAXS)

Xenocs • Xeuss 3.0

$75.00/hr
Princeton University
0.0(0)
PerkinElmer DMA-8000 Dynamic Mechanical Analyzer (DMA)
available
Thermal Analysis and Rheometry

PerkinElmer DMA-8000 Dynamic Mechanical Analyzer (DMA)

PerkinElmer • DMA-8000

$75.00/hr
Princeton University
0.0(0)
PerkinElmer TGA-GC/MS: TGA-8000 Thermogravimetric Analyzer (TGA), Clarus 680 Gas Chromatography (GC), Clarus SQ 8 T Mass Spectrometry (MS) hyphenated system
available
Thermal Analysis and Rheometry

PerkinElmer TGA-GC/MS: TGA-8000 Thermogravimetric Analyzer (TGA), Clarus 680 Gas Chromatography (GC), Clarus SQ 8 T Mass Spectrometry (MS) hyphenated system

PerkinElmer • TGA-8000, Clarus 680, Clarus SQ 8 T

$75.00/hr
Princeton University
0.0(0)
Aquilos 2 Cryo-Focused Ion Beam (Cryo-FIB)
available
Focused Ion Beam System (FIB)

Aquilos 2 Cryo-Focused Ion Beam (Cryo-FIB)

Thermo Fisher Scientific • Aquilos 2

$75.00/hr
Princeton University
0.0(0)
Fischione NanoClean Plasma Cleaner
available
Sample Preparation

Fischione NanoClean Plasma Cleaner

Fischione • NanoClean

$75.00/hr
Princeton University
0.0(0)
Leica Ultracut UCT Ultramicrotome
available
Sample Preparation

Leica Ultracut UCT Ultramicrotome

Leica • Ultracut UCT

$75.00/hr
Princeton University
0.0(0)
Vitrification Robot
available
Sample Preparation

Vitrification Robot

FEI • Vitrobot

$75.00/hr
Princeton University
0.0(0)
Talos L120C G2 Transmission Electron Microscope
available
Transmission Electron Microscopy (TEM)

Talos L120C G2 Transmission Electron Microscope

FEI • Talos L120C G2

$75.00/hr
Princeton University
0.0(0)

Showing 20 of 45 instruments.

View Full Catalog

Verified Location

Capabilities

Sample PreparationOptical Microscopy and SpectroscopySurface AnalysisMicroscopyTransmission Electron Microscopy (TEM)Thermal Analysis and RheometryXRD, SAXS & 3D X-Ray MicroscopeScanning Probe Microscopy (SPM)Focused Ion Beam System (FIB)Scanning Electron Microscopy (SEM)

How to Access

  1. Submit request via CapNet.
  2. Receive official quote.
  3. Accept & connect.
Start Request