Hitachi SU7000 Scanning Electron Microscope

Scanning Electron Microscope Hitachi SU7000 Scanning Electron Microscope Ultra-high-resolution imaging, structural, and compositional analysis Key Functionalities •Ultra-high-resolution imaging, structural and compositional analysis •Multi-channel imaging capability allowing for correlated acquisition of structural, topographic, compositional, crystallographic, and other types of information •Variable-pressure capability for observation of insulating samples •Energy dispersive X-ray (EDX) analysis and electron backscatter diffraction (EBSD) analysis •User-friendly SEM interface allows for easy operation Key Configuration Parameters •multi-detector configuration; secondary (UD, MD, LD), backscattered, and ultra-variable pressure detectors •Schottky field-emission electron source for ultra-high-resolution imaging at low and high accelerating voltages AND excellent micro-analysis (EDS, EBSD) performance •0.1-30 keV accelerating voltage •5-300 Pa variable pressure range •Large specimen chamber and large stage (suited for high-volume and specialty applications) •Automated, motorized stage utilizing integrated camera navigation •Energy dispersive Xray spectrometer (EDX) •Electron backscattered diffraction detector (EBSD)