Titan Cubed Themis 300 double Cs-corrected Scanning/Transmission Electron Microscope (S/TEM)

Capabilities

• ✓A Schottky X-FEG high brightness electron source with 0.07 nm (TEM), 0.06 nm (STEM) information limit.
• ✓Double Cs-corrector DCOR (Cs image + DCOR probe corrector).
• ✓Flexible high tension range from 60 to 300 kV.
• ✓Symmetric Ruska-Rieke constant power S-TWIN objective lens for thermal stability and easy mode switching.
• ✓Industry-leading high-speed, high-throughput, windowless 4-detector, Super-X energy dispersive X-ray spectroscopy (EDS) signal detection.
• ✓A Gatan Quantum SE/963 P post-column energy filter equipped with a 2k x 2k CCD for energy filtered TEM (EFTEM) and UltraFast (up to 1000sp/s) electron energy-loss spectra (EELS) data acquisition.
• ✓Differential phase contrast (DPC) imaging for electromagnetic studies.
• ✓Automatic apertures and reproducible recall.
• ✓Rotation-free imaging for clear orientation.
• ✓Computerized 5-axis specimen stage with piezo-enabled drift compensation.