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Titan Cubed Themis 300 double Cs-corrected Scanning/Transmission Electron Microscope (S/TEM)
FEI Titan Cubed Themis 300
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The premiere aberration-corrected S/TEM for atomic-resolution characterization, including differential phase contrast (DPC), bright field, dark field and high-angle annular dark field imaging, electron diffraction, and quantitative elemental analysis/mapping, and EELS acquisition.
Capabilities
- ✓A Schottky X-FEG high brightness electron source with 0.07 nm (TEM), 0.06 nm (STEM) information limit.
- ✓Double Cs-corrector DCOR (Cs image + DCOR probe corrector).
- ✓Flexible high tension range from 60 to 300 kV.
- ✓Symmetric Ruska-Rieke constant power S-TWIN objective lens for thermal stability and easy mode switching.
- ✓Industry-leading high-speed, high-throughput, windowless 4-detector, Super-X energy dispersive X-ray spectroscopy (EDS) signal detection.
- ✓A Gatan Quantum SE/963 P post-column energy filter equipped with a 2k x 2k CCD for energy filtered TEM (EFTEM) and UltraFast (up to 1000sp/s) electron energy-loss spectra (EELS) data acquisition.
- ✓Differential phase contrast (DPC) imaging for electromagnetic studies.
- ✓Automatic apertures and reproducible recall.
- ✓Rotation-free imaging for clear orientation.
- ✓Computerized 5-axis specimen stage with piezo-enabled drift compensation.
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