CreaTec LT STM/nc-AFM

The CreaTec Special Low-Temperature STM type LT-STM-AFM-CE system rely on the combination of Scanning Tunneling Microscopy (STM) with qPlus based Atomic Force Microscopy (AFM) techniques. While STM can reveal band structures, electronic states for materials, electron orbital related signal for molecules, qPlus based non-contact AFM offers sub-molecular real-space atomic resolution for materials and organic molecules. This system is mainly used to study the electronic states, electron orbitals and the atomic structure information of molecules, to identify the chemical structures of unknown organic compounds. Low temperature (4K) constant current STM imaging, scanning tunneling spectroscopy (STS), constant frequency AFM imaging, constant height AFM imaging, and force spectroscopy measurement can be conducted.