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Talos F200X Scanning/Transmission Electron Microscope (S/TEM)
FEI Talos F200X
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Room temperature S/TEM imaging and analysis including differential phase contrast (DPC), bright field, dark field and high-angle annular dark field imaging, electron diffraction, highly sensitive 4-detector Super-X EDS for quantitative elemental analysis and mapping.
Capabilities
- ✓X-FEG high brightness electron source (1.8x109 A/cm2srad @200 kV) with 0.12 nm (TEM), 0.16 nm (STEM) information limit.
- ✓Flexible high tension range from 60 to 200 kV.
- ✓Constant power A-TWIN objective lens for thermal stability and easy mode switching.
- ✓Industry-leading high-speed, high-throughput, windowless 4-detector, Super-X energy dispersive X-ray spectroscopy (EDS) signal detection.
- ✓Differential phase contrast (DPC) imaging for electromagnetic studies.
- ✓Automatic apertures and reproducible recall.
- ✓Rotation-free imaging for clear orientation.
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