Apreo 2 S LV FEG Scanning Electron Microscope

The FEI Apreo 2 S combines high- and low-voltage ultra-high resolution capabilities with a low vacuum mode for non-conductive material. The electron detectors are optimized for fast imaging and easy collection of all available signals. The Apreo 2 S can operate in traditional high vacuum mode, high vacuum with immersion mode and beam deceleration as well as low vacuum mode for non-conductive specimens that do not tolerate normal coating procedures. SEM Imaging: Traditional high vacuum secondary electron imaging. Large Area SEM Imaging: Using MAPS software, many images are acquired and stitched together in large format as a project. This capability allows larger resin blockfaces than TEM imaging and with inverted image contrast, the images look like they were generated with a TEM (no grid bars). Cryo SEM Imaging: Beam sensitive samples can be frozen in liquid nitrogen slush and imaged on a temperature-controlled stage to preserve structure. Example: hydrogels. Volumescope 3D Imaging: Using a special stage with a diamond knife installed, the sample blockface can be imaged and sectioned repeatedly to obtain a stack of 2D images that can be reconstructed in 3D. Electron Optics: Field emission gun (Schottky) with SmartAlign technology. Voltage: 200 eV to 30 keV. Beam Current: 1 pA to 50 nA. Resolution: high vacuum, field free mode = 1.2 nm at 1 kV; high vacuum, immersion mode = 0.9 nm at 1 kV. Vacuum: Oil-free vacuum system, high vacuum mode, low vacuum mode with water vapor added to the chamber for non-conductive samples that will not tolerate coating. Sample Navigation: High precision specimen goniometer with 110 mm travel in x and y, 5-axes motorized x-y-z-tilt-rotate stage, unique standard specimen holder with labeled positions Navigation camera allows for double-click-to-center, stores and recalls positions, compucentric rotation and tilt. Scanning System: High-resolution digital scanning engine controlled from the User Interface, selectable pixel density,