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Siemens/Bruker D-5000 XRD System
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The Siemens/Bruker D-5000 features: theta/theta vertical goniometer system with optional spinner (phi) rotation (Bragg Brentano configuration). Radiation /wavelength: Cu K-alpha, 0.15418 nm Main optics: soller slits, divergence slit, scatter slit, receiving slit, detector slit, curved graphite monochromator, scintillation detector Applications
Capabilities
- ✓Powder and polycrystalline bulk materials; limited applicability to soft samples.
- ✓Phase identification, composition quantification, crystallographic structure determination.
- ✓Crystallite / grain size and strain analysis.
- ✓Limited texture (preferred orientation) analysis.
- ✓Location 148 MRL
- ✓Related Research Techniques X-Ray Diffraction (XRD) and Scattering
- ✓Related Research Cores X-Ray Analysis
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