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PANalytical X'Pert MRD Material Research Diffractometer
PANalytical X'Pert MRD
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Our PANalytical X'Pert MRD Material Research Diffractometer (MRD) x-ray diffractometer has many options and can be used for conventional and high resolution/quantitative powder x-ray diffraction, surface and thin film diffraction, and texture analysis. Contact Tom Trainor for details.