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Electron Microprobe (EPMA)
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Electron Probe Microanalysis (EPMA) is an elemental analysis technique that uses a focused beam of high-energy electrons to non-destructively ionize a solid specimen surface, which induces the emission of x-rays that are characteristic to the elements present.
Capabilities
- ✓Quantitative elemental analysis of materials
- ✓Establishing bulk compositions at the micron to sub-micron scale
- ✓Geological studies: mineral analysis, igneous petrology, etc.
- ✓Metallurgical research and failure analysis
- ✓Thin film composition determinations
- ✓Semiconductor materials and ceramic analyses
- ✓Anthropological and art history investigations
- ✓5 wavelength dispersive spectrometry (WDS) Bragg spectrometers, each equipped with 2-4 diffraction crystals
- ✓ThermoFisher Scientific System Six Silicon Drift Detector (SDD) for EDS
- ✓Capable of simultaneous WDS and EDS acquisitions
- ✓SE, BSE, and CL detectors