Available
TEM: JEOL JEM1400
JEOL JEM1400
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Transmission Electron Microscope, High Resolution Imaging, Gatan OneView sCMOS Image Acquisition with drift correction, High Tilt Series Tomographic Images, For data published using this microscope you must acknowledge NIH ORIP: 1 S10 OD028536-01
Capabilities
- ✓Transmission Electron Microscopy
- ✓High Resolution Imaging
- ✓Drift Correction
- ✓Tomographic Imaging
Specifications
| type | Transmission Electron Microscope |
| imaging | High Resolution Imaging |
| camera | Gatan OneView sCMOS Image Acquisition with drift correction |
| tomography | High Tilt Series Tomographic Images |
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