Nikon Eclipse MA200 Inverted Optical Microscopy

Key Functionalities •Suited to analysis of larger samples •Can be used to characterize samples where visualization through the bottom of a vessel is required (e.g., due to physical state, settling of material of interest, etc.) •Brightfield, darkfield, simple polarization, and differential interference contrast microscopy Important Configuration Parameters •Inverted configuration •Bright-field, dark-field, polarized, differential interference contrast microscopy •TU Plan Fluor BD 5x, 20x, 50x, 100x, CFI TU BD EPI Plan Fluor 10x objectives and 10x/22 eyepiece •Interfaced to PC with OmniMet Enterprise Image Analysis software •Digital USB color camera for image capture