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JEOL 2010 LAB6 TEM
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A comparative table of the TEM systems available in the MRL is given here. The JEOL 2010 LaB6 is a conventional TEM. It is optimized for BF/DF imaging, diffraction and high sample tilts. It operates at 80, 100, 120 and 200kV. The 2010 LaB6 is equipped with a combined video rate/slow scan camera for real time imaging and final image recording. A double tilt holder is available with 35/24 degrees of tilt. Double tilt heating and liquid N2 stages are available.
Capabilities
- ✓LaB6 filament electron gun
- ✓Energy 80, 100, 120 and 200kV
- ✓Tilt 35/24 degrees on two axes
- ✓Point resolution = 0.194 nm, Lattice Resolution: 0.14 nm, OL Focal length: 1.8 mm
- ✓Information Limit > 0.14nm
- ✓Lens Type-Side entry (Condenser/Objective)
- ✓Digital Imaging - Gatan SC1000, 4000x2600 pixels
- ✓Computer Control - Digital Micrograph
- ✓Free Lens Control 900ºC double tilt holder
- ✓Liquid N2 double tilt holder
- ✓Location 0017 Supercon
- ✓Related Research Techniques Transmission and Scanning Transmission Electron Microscopy (TEM/STEM)
- ✓Related Research Cores Electron Microscopy (EM)
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