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Nikon N-SIM E Super-Resolution System with A1+ Confocal Microscope on the Eclipse Ti2 Inverted Microscope
Nikon N-SIM E
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This system combines confocal and super-resolution capabilities in one setup. Visualization of small intracellular structures and their function can be achieved using structured illumination (SIM) technology. The N-SIM E realizes double the spatial resolution of conventional optical microscopes (to approximately 115 nm)
Specifications
| Stage | Fully motorized XY stage, Motorized Piezo Z stage for high-speed Z-direction scanning |
| Confocal Laser Lines | Four laser lines (408 nm, 488 nm, 561 nm, 640 nm) for confocal imaging |
| Detectors | Four detectors: blue, green, red, far red; with two high sensitivity GaAsP detectors |
| Scanners | High-resolution Galvano scanner with pixel size up to 4096 x 4096; scan speed 2 fps at standard mode and 10 fps in fast mode (at 512 x 512 pixels, bi-direction), High definition 1K resonant scanner with maximum resolution of 1024 x 1024 pixels (15 fps) and scanning speed up to 420 fps (at 512 x 32 pixels) |
| Camera | Hamamatsu ORCA-Flash4.0 camera |
| SIM Laser Unit | LU-N3-SIM laser unit with three wavelength lasers (488/561/640 nm), enabling super-high resolution imaging in multiple colors; lateral resolution 115 nm and axial resolution 269 nm in 3D-SIM mode (at 488 nm excitation wavelength) |
| Incubator | Tokai Hit Stage top Incubator with temperature and CO2 control |
| Software | N-SIM analysis software |
| Objectives | Plan Apo λ 10x, Plan Apo VC 20x, Plan Fluor 40x Oil, Apo 60x λS Oil, SR HP Apo TIRF 100x Oil |
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