FEI Tecnai F20 TEM/STEM
FEI Tecnai F20
The 200kV FEI Tecnai F20 Super-Twin is designed to produce optimum high-resolution performance in both TEM and STEM. This microscope features a 2048x2048 CCD camera positioned after the Gatan Imaging Filter (GIF) that can be used for both dedicated spectroscopic analysis and energy-filtered imaging. The high Resolution Gatan Rio Camera can deliver high resolution and real time speed for imaging applications. This microscope is optimized for materials applications that require either high-resolution STEM performance (imaging and spectroscopy by Electron Energy Loss Energy and Dispersive XRAY) or correlated imaging and analytical methods (for TEM and STEM). The Tecnai F20 is equipped with a Lorentz Lens for magnetic imaging in Fresnel and Fouccault modes, and a NanoMegas Astar system for automated phase/orientation mapping of nanocrystals materials. Also available is the Gatan STEMx System, which is a powerful tool that adds 4D STEM diffraction capabilities to the Gatan in-situ Rio camera.
Capabilities
- âś“TEM
- âś“STEM
- âś“Electron Energy Loss Energy Spectroscopy
- âś“Energy Dispersive X-ray Spectroscopy
- âś“Lorentz Lens for magnetic imaging
- âś“NanoMegas Astar system for automated phase/orientation mapping
- âś“Gatan STEMx System for 4D STEM diffraction
Specifications
| Electron source | Flexible high tension (20, 40, 80, 120, 160, 200 kV and values in between), Schottky field emitter with high maximum beam current (> 100 nA), High probe current (0.5 nA or more in 1 nm probe), Small energy spread (0.7 eV or less) • Spot drift < 1 nm/minute |
| Specimen stages | FEI Single Tilt Holder +40°, FEI Double Tilt Holder +30°, Tomography holder + 80°, Gatan 636-DH low background, Liquid nitrogen cooling holder -170°C/ 23°C, Magnetizing Holder: In-plane magnetic field up to 900 Gauss, Electron imaging from -300 Oe to +300 Oe, Nanofactory Holder single tilt, for electron and force nanoprobing |
| Imaging | Everhardt Thornley SED (secondary electron detector), TEM point resolution (.24nm), TEM line resolution (.102nm), Information limit (.14nm), Extended resolution (TrueImage) Minimum focus step (.16nm), TEM magnification range 25X-1030kx, Camera length 30-4500mm, Maximum diffraction angle STEM HAADF resolution (.19nm), STEM magnification range Maximum tilt angle with double-tilt holder + 40°, Maximum tilt angle with tomography holder + 80°, EDS solid angle 0.13 srad |
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