The Vista One PiFM-Raman microscope from Molecular Vista enables nano-IR measurements with very high resolution (~10nm lateral resolution for mapping and spectroscopy) in the wavenumber range 1908 - 752 cm-1. The strength of this technique is obtaining chemical information on surfaces with AFM-scale resolution. This instrument is capable of photo-induced force microscopy (PiFM), photo-induced force infrared spectroscopy (PiF-IR), Raman spectroscopy, and non-optical AFM techniques such as Kelvin probe force microscopy (KPFM). Photo-induced force microscopy (PiFM) and photo-induced force infrared spectroscopy (PiF-IR) are complementary to FTIR (https://molecularvista.com/technology/comparisons/pif-ir-vs-ftir/), Raman and TERS, scattering SNOM, and AFM.
Capabilities
- âś“Location 0022 Supercon
- âś“Related Research Techniques Atomic Force Microscopy (AFM)MicroscopyScanning Probe Optical SpectroscopySpectroscopy
- âś“Related Research Cores Laser and SpectroscopyScanning Probe Microscopy
