The Keithley 4200 Semiconductor Characterization System is a parametric analyzer with a Windows XP based software environment which provides for measurement of DC I-V, C-V, and pulse characterization and stress-measurement/reliability testing of semiconductor devices and test structures. This instrument is equipped with a Capacitance Voltage Unit capable of nanoFarad (nF) level measurements at frequencies from 10kHz to 10MHz and also two Source-Measure Units with 1A/20W capability.

Capabilities

✓DC I-V characterization
✓C-V measurements
✓Pulse characterization
✓Stress testing
✓Reliability testing
✓Semiconductor device testing
✓High precision measurements

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Specifications

model	4200 SCS
measurements	DC I-V, C-V, pulse
cv frequency	10kHz to 10MHz
smu capability	1A/20W

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