
Available
It is fast and reliable mechanical method of pre-thinning TEM sample to near electron transparency to greatly reduce ion milling times and uneven thinning. Advantages includes: Large transparent areas; stronger specimen with a thick supporting rim to protect and strengthen the specimen after dimpling; accurate depth and thickness control.
Capabilities
- ✓Location B56 MRL
- ✓Related Research Techniques EM Support Instruments
- ✓Related Research Cores Electron Microscopy (EM)
Similar Instruments

Available
Commercial Rate
Request Quote →
Available
Commercial Rate
Request Quote →
Available
Commercial Rate
Request Quote →
Available
Commercial Rate
Request Quote →