Available
Scanning Electron Microscopes (SEM)
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Scanning Electron Microscopy (SEM) is a powerful imaging technique widely used in materials science, biology, and engineering. It uses a focused beam of electrons to scan the surface of a sample, producing detailed images with exceptional depth of field. This technique allows for the examination of microstructures and surface features at magnifications up to several hundred thousand times. SEM is invaluable for analyzing the morphology, composition, and topography of materials.
Capabilities
- βHigh-resolution SEM imaging
- βElectron beam lithography
- βElemental analysis via energy dispersive x-ray spectroscopy (EDS)
- βHigh and low vacuum modes for analyzing conductive and insulating samples
- βSE, BSE and cathodoluminescence (CL) detectors, insertable CBS detector
- βEDS detector
- βNabity NPGS electron beam lithography system
- β5-axesβ―eucentric stage
- βDrift-corrected frame integration imaging
- βField emission electron beam source with 1nm SEM imaging resolution
- βNabity NPGS electron beam lithography system
- βLarge chamber capacity
- β5-axes stage able to view/write an entire 4-inch wafer
- βIn-lens SE, in-lens BSE, and Everhart-Thornley electron detectors
