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JEOL JEM-2200FS Energy Filtered Transmission Electron Microscope
JEOL JEM-2200FS (2025)
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The JEOL JEM-2200FS EFTEM features an in-column Electron Energy Loss Filter for EELS and EFTEM and an Oxford X-MAX 80mm2 Energy Dispersive X-ray Spectrometer. The instrument is setup for analytical applications such as Electron Tomography while still maintaining high-resolution in High Angle Annular Dark Field Imaging. Features Schottky Thermal Field Emitter Source.
Capabilities
- ✓Energy Filtered Transmission Electron Microscopy (EFTEM)
- ✓Electron Energy Loss Spectroscopy (EELS)
- ✓Energy Dispersive X-ray Spectroscopy (EDS)
- ✓Scanning Transmission Electron Microscopy with HAADF
- ✓Electron Tomography (TEMT)
- ✓High-resolution imaging
- ✓Analytical applications
- ✓Schottky thermal field emitter
Specifications
| model | JEM-2200FS |
| filter | In-column electron energy loss filter |
| eds detector | Oxford X-MAX 80mm² |
| source | Schottky thermal field emitter |
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