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JEOL JCM-6000Plus NeoScope Scanning Electron Microscope
JEOL JCM-6000Plus NeoScope (2025)
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Latest benchtop SEM technology with touch panel control. High-sensitivity semiconductor detectors for composition contrast and efficient analysis. High-vacuum functionality and secondary electron detector for fine structure observation at high magnification. Automatic image formation in 3 minutes, 60,000X resolution, multi-touch interface, automatic focus/stigmation/brightness/contrast.
Capabilities
- ✓Scanning electron microscopy
- ✓Composition contrast
- ✓High magnification imaging
- ✓Automatic operation
- ✓Benchtop SEM
Specifications
| resolution | 60,000X |
| imageTime | 3 minutes |
| interface | Multi-touch panel |
| contactInfo | [object Object] |
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