ThermoFisher Scientific Talos F200X G2 Scanning Transmission Electron Microscope (S/TEM)
A comparative table of the TEM systems available in the MRL is given here. The ThermoFisher Talos F200X G2 is a 200 kV FEG Scanning Transmission Electron Microscope (S/TEM) that combines outstanding quality in high-resolution STEM and TEM imaging with high throughput EDS signal detection and 3D chemical characterization with compositional mapping. It is designed for fast, precise and quantitative characterization of nano-materials. It accelerates nano-analysis of materials based on higher data quality, faster acquisition, and simplified and automated operation. The system’s Constant-Power™ X-TWIN lens delivers outstanding optical performance to help ensure an optimal balance of contrast and resolution. The microscope comes with numerous advanced functions and new features: X-FEG high-brightness electron source for high brightness, high temporal and spatial coherence.
Capabilities
- ✓Constant-Power Objective lens control stabilizes the optics while switching between various optical modes.
- ✓Lorentz Lens enabling imaging magnetic structures in field-free conditions.
- ✓The EMPAD (Electron Microscope Pixelated Array Detector) pixelated detector for acquiring the diffraction pattern in each pixel of a STEM image, with the speed of up to 1100 fps.
- ✓The 4D STEM software package for the Ceta™ 16M camera, synchronizes the STEM spot movement with the readout of the camera.
- ✓Segmented Panther STEM detector, along with HAADF detector, provides access to a large range of BF and DF STEM imaging techniques with 4k x 4k STEM image acquisition.
- ✓TEM Tomography, STEM Tomography, and EDS Tomography data acquisition software packages provide capability to obtain 3D structure and chemical information.
- ✓Inspect3D Xpress hardware and software for carrying out alignment of tomography data and subsequent ultra-fast tomographic reconstruction
- ✓Align Genie fully automated software for aligning and (fine-) tuning the optics and column alignments in TEM mode.
- ✓AutoSTEM automated alignment software for the correction of focus and astigmatism correction in STEM mode up to 1 Mx magnification.
- ✓Computerized 5-axes Piezo enhanced stage ensures drift-free imaging with high sensitivity and precise sample navigation.
- ✓Fully computer controlled and motorized apertures whose alignments and positions are automatically recalled.
- ✓A new high speed, high dynamic range, damage insensitive digital Search and View Camera SmartCam replacing conventional fluorescent screen.
- ✓Probe current and STEM detector collection angles indicated in real time in TEM user interface.
- ✓The microscope will be installed with column alignments at 80, 100 and 200 kV.
- ✓HRTEM line resolution: 0.10 nm
Similar Instruments
