COMING SOON! Atomic Resolution Analytical Microscope - JEOL JEM-ARM300F2

Capabilities

• ✓Highly stable Cold FEG
• ✓Probe aberration corrected STEM with spatial resolution up to 53 pm at 300 kV
• ✓Aligned at 80, 200 and 300 kVs tailed for different materials system
• ✓Bright field (BF), annular bright field (ABF) and high annular dark field (HAADF) image modes in STEM
• ✓Optimal bright field (OBF) images enabled by Octa segmented annular all field (SAAF) STEM detector for low dose imaging of beam sensitive materials, and real time visualization of electric field and magnetic field in the sample
• ✓Advanced dose control by the IDES electrostatic dose modulator in both TEM and STEM modes
• ✓Routine atomic STEM-energy dispersive X-ray (EDS) elemental mapping enabled by two large area SDD EDS detectors and STEM probe correction
• ✓Gatan image filter (GIF) Continuum 1065ST with Dual EELS, energy fileted TEM and 4D-STEM on electron direct detector Stela camera