SEM/FIB Focused Ion Beam - Nova 200 NanoLab (FEI)

Capabilities

• ✓Focused ion beam and sample preparation
• ✓Eyring Materials Center
• ✓SEM/FIB Focused Ion Beam - Nova 200 NanoLab (FEI)
• ✓High-resolution Field Emission-SEM column, with monopole magnetic immersion final lens, Schottky thermal field emitter, 60 degree objective lens geometry and heated objective apertures.
• ✓Resolution @ optimum WD. 1.1 nm @ 15 kV (TLD-SE). 2.5 nm @ 1 kV (TLD-SE). 3.5 nm @ 500V TLD-SE. 5.5 nm @ 500 V TLD-BSE.
• ✓1.1 nm @ 15 kV (TLD-SE).