Available
SEM/FIB Focused Ion Beam - Nova 200 NanoLab (FEI)
FEI Nova 200 NanoLab
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Commercial Rate
Focused ion beam and sample preparation
Capabilities
- ✓Focused ion beam and sample preparation
- ✓Eyring Materials Center
- ✓SEM/FIB Focused Ion Beam - Nova 200 NanoLab (FEI)
- ✓High-resolution Field Emission-SEM column, with monopole magnetic immersion final lens, Schottky thermal field emitter, 60 degree objective lens geometry and heated objective apertures.
- ✓Resolution @ optimum WD. 1.1 nm @ 15 kV (TLD-SE). 2.5 nm @ 1 kV (TLD-SE). 3.5 nm @ 500V TLD-SE. 5.5 nm @ 500 V TLD-BSE.
- ✓1.1 nm @ 15 kV (TLD-SE).
Specifications
| Cost for ASU Internal | Cost for ASU Internal with Staff Assistance |
| $76.44/h | $119.49/h |
