X-Ray Photoelectron Spectroscopy - Kratos Axis Supra  XPS

The Kratos Axis Supra XPS (X-ray Photoelectron Spectroscopy) system offers surface analysis, surface chemical mapping, Surface imaging, and depth profiling of metallic, semi-metallic and nonmetallic samples as deep as 1 nm. The sample is evacuated to 10-9 Torr or better, for quality measurements. The system is designed around a 165 mm mean radius hemispherical analyzer and Spherical mirror Analyzer, which allows for sensitive analysis as well as fast parallel imaging onto the 2D delay line detector. By using a magnetic immersion lens, high sensitivity is apparent on the analysis areas as small as 15um with spatial resolution as small as 1um. The charge neutralization system allows high resolution spectra to be obtained from insulating materials such as polymers using either the standard Mg/Al source or the Al/Ag monochromatic source. The instrument is controlled by the Escape data system, on a Windows 7 computer workstation. Learn more about XPS here. The Knowledge Base contains forms, instruction and training material, minutes, policies, tools and other resources to support your research efforts by topic area. W123 Parsons HallDurham, NH 03824Phone: (603) 862-1092 UNH Rate: $77.00/hour  assisted$20.00/hour  unassisted Non UNH academic Rate: $130.00/hour  assisted  $32.00/hour  unassisted Industry Rate:$250.00/hour assisted$150.00/hour unassisted