R2R Contact Lithography Active Alignment Registration System
Available

R2R Contact Lithography Active Alignment Registration System

Custom Contact Lithography System (2025)

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Moving web tool uses gravure/meyer-rod coating of functional resist or thin-film with contact print to mask pattern for direct photolithographic exposure by UV source. Imaging feedback enables active alignment of patterns.

Capabilities

  • Roll-to-roll contact lithography
  • Active pattern alignment
  • Gravure coating
  • Meyer-rod coating
  • UV photolithographic exposure
  • Imaging feedback system
  • Pattern registration

Specifications

techniqueContact lithography
coatingGravure/meyer-rod
alignmentActive pattern recognition
exposureUV source