Available
For single wavelength, multiple angle ellipsometry.
Capabilities
- âś“Fixed wavelength (632.8 nm) variable angle Stokes ellipsometer
- âś“Measures index of refraction and thickness of a thin film or bulk materials
- âś“Location 148 MRL
- âś“Related Research Techniques Ellipsometry
- âś“Related Research Cores Laser and Spectroscopy
