JEM-2010F FasTEM

The JEM-2010F FasTEM provides 1.9 Å point resolution and 1.0 Å lattice resolution with an information limit of 0.75 Å. A few peripheral attachments further enhance its analytical capabilities; these include the scanning transmission electron microscopy (STEM) for both bright field (STEM-BF) imaging and high angle annular dark field (STEM-HAADF) imaging, electron energy loss spectroscopy (EELS) and energy filtered imaging, and X-ray energy dispersive spectroscopy (XEDS). In addition, this instrument allows remote access and remote control through internet connection.