Atomic Force Microscope

Sample Characterization Equipment. Location: Olney OG-3. Training Estimates: 6 Hours. An Atomic Force Microscope (AFM) consists of a Si or Si3N4 microscale cantilever that has a very sharp tip (usually 5-15nm radius). The tip is brought to very close proximity to the sample surface and scanned laterally across the surface. Forces between the tip and the atoms on the sample surface lead to vertical deflections of the cantilever according to Hooke's Law. By monitoring the deflection using a laser spot reflected from the top of the cantilever onto a position sensitive photodetector array, one can construct a 3-dimensional topographic map of the sample surface. Typical image lateral resolution is in the order of the tip radius, although atomic resolution can be achieved in non-contact mode. The vertical resolution can be in the order of angstroms. Include Sample Description and Analysis Requirements in note section of Order Form.