FEI Helios Nanolab 650

The Focused Ion Beam Dual Beam Microscope is a scanning microscope with very high-resolution topographical imaging and etching capabilities. The Helios NanoLabTM 650 features FEI’s most recent advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies and their combined use. It is designed to access a new world of extreme high resolution (XHR) 2D and 3D characterization, nanoprototyping, and higher quality sample preparation. When publishing or presenting results collected from the dbFIB, please use the following acknowledgement: “This work made use of University of Utah Nanofab shared facilities supported, in part, by the MRSEC Program of the NSF under Award No. DMR-112125” Goral, J.; Deo, M.; McLennan, J.; Huang, H.; Mattson, E. Macro- and Micro-Compression Testing of Shales J. Petrol. Sci. Eng. 2020, 191, 107034 Jackson, M.D.; Couper, S.; Stan, C.V.; Ivarsson, M.; Czabaj, M.W.; Tamura, N.; Parkinson, D.; Miyagi, L.M.; Moore, J.G. Authigenic Mineral Texture in Submarine 1979 Basalt Drill Core, Surtsey Volcano, Iceland Geochem. Geophys. 2019, 20, 3751 – 3773 Plumb, J.C.; Lind, J.F.; Tucker, J.C.; Kelley, R.; Spear, A.D. Three-Dimensional Grain Mapping of Open-Cell Metallic Foam by Integrating Synthetic Data with Experimental Data from High-Energy X-ray Mater. Charact.  2018, 144, 448-460. Edwards, M.A., German, S.R., Dick, J.E., Bard, A.J., and White, H.S. High-Speed Multipass Coulter Counter with Ultrahigh Resolution ACS Nano, 2015, 9, 12274 – 12282.