Scanning Probe/ Atomic force Microscopy (SPM/AFM)

Capabilities

• ✓Surface imaging
• ✓Eyring Materials Center
• ✓Scanning Probe/ Atomic force Microscopy (SPM/AFM)
• ✓Standard JVLR scanner has ~ 140 μm lateral (XY) scan range and ~ 5.6 μm vertical (Z) scan range. Other scanners may be available for use; please inquire with staff.
• ✓In acoustic enclosure, image noise (in Z) ~ 50 pm.
• ✓The scanner can accommodate samples that are less than 15 mm in diameter.