Available
Scanning Probe/ Atomic force Microscopy (SPM/AFM)
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Commercial Rate
Surface imaging
Capabilities
- ✓Surface imaging
- ✓Eyring Materials Center
- ✓Scanning Probe/ Atomic force Microscopy (SPM/AFM)
- ✓Standard JVLR scanner has ~ 140 μm lateral (XY) scan range and ~ 5.6 μm vertical (Z) scan range. Other scanners may be available for use; please inquire with staff.
- ✓In acoustic enclosure, image noise (in Z) ~ 50 pm.
- ✓The scanner can accommodate samples that are less than 15 mm in diameter.
Specifications
| Cost for ASU Internal | Cost for ASU Internal with Staff Assistance |
| $30.35/h | $73.40/h |
