Ellipsometer
Available

Ellipsometer

Woolam Alpha SE (2025)

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Commercial Rate

Note: all equipment is reserved in increments of 30min. The Alpha SE provides the University with a unique capability for measuring very thin dielectric films (<100 nm) and calculating the index of refraction of said films. It is also capable of measuring liquids which is of use to the Bio Bay users. JA Woolam also provides a applications and support staff of 9 engineers to assist researchers. This tool is critical for completing a measurement suite to measure materials thinner than 100nm and films that cannot be measured at normal incidence.

Capabilities

  • Thin film measurement
  • Dielectric film analysis
  • <100nm thickness capability
  • Index of refraction calculation
  • Liquid measurement
  • Bio Bay applications
  • Non-normal incidence
  • 30 minute increments

Specifications

manufacturerWoolam
modelAlpha SE
film thickness<100 nm
materialsDielectric films, liquids
measurementIndex of refraction
reservation30 minute increments
support9 engineers available

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