PANalytical Phillips X’pert MRD system #2

Capabilities

• ✓Option 1: General thin film and bulk phase, stress and texture analysis. Point focus beam, crossed-slit collimator or x-ray lens, parallel plates collimator, flat graphite monochromator and proportional detector.
• ✓Option 2: Fast texture and stress configuration using 1D detector. Point focus beam, x-ray lens, PIXcel line detector in high-speed mode
• ✓Option 3: Micro XRD setup for surface spatial resolution between 100 and 400 microns. Point focus beam, 100-microns monocapillary primary optics, PIXcel line detector in high-speed mode
• ✓Optional attachment: dome-shaped Anton Paar DHS900 hot stage for in-situ high temperature (up to 900°C) analysis under air or vacuum
• ✓General thin film or coatings analysis
• ✓Glancing incidence x-ray diffraction for analysis of ultra-thin films or analysis of depth-dependent phase, crystallinity and texture variations in materials.
• ✓Texture / preferred orientation and stress analysis.
• ✓Micro XRD for applications requiring spatial resolution between 100 and 400 microns.
• ✓In-situ high-temperature (up to 900oC) XRD analysis for phase transition, thermal expansion coefficient determination, stress and texture variations in materials.
• ✓Typical materials: textured thin films and bulk materials.
• ✓Location 148 MRL
• ✓Related Research Techniques X-Ray Diffraction (XRD) and Scattering
• ✓Related Research Cores X-Ray Analysis