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Gaertner L116C Ellipsometer
Gaertner L116C (2025)
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The Gaertner L116C Ellipsometer offers noncontact measurement of transparent and translucent films using a 632.2 nm wavelength HeNe laser. The rotating analyzer samples 144 data points and can measure films of thickness from 0 to 60000 Å with an accuracy of +/-3 Å and a repeatability of +/-1 Å over most of the measurement range.
Capabilities
- ✓Non-contact film thickness measurement
- ✓Transparent film analysis
- ✓Translucent film analysis
- ✓High accuracy measurement
- ✓Wide thickness range
- ✓Automated data collection
Specifications
| model | L116C |
| wavelength | 632.2 nm HeNe laser |
| thickness range | 0 to 60,000 Å |
| accuracy | +/-3 Å |
| repeatability | +/-1 Å |
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