Scanning Transmission Electron Microscope (STEM) | JEOL JEM-2100F Field-Emission STEM

Capabilities

• ✓High brightness Schottky field emitter
• ✓Resolution: 0.23 nm point-to-point, 0.1 nm lattice; high-resolution pole piece
• ✓Bright field (BF), dark field (DF), and high-angle annular dark-field (HAADF) detectors
• ✓High resolution lattice imaging (HRTEM)
• ✓Bruker SDD Energy Dispersive X-ray Spectroscopy (EDXS) system
• ✓Gatan Tridiem electron energy imaging filter (GIF) system for Electron  Energy Loss Spectroscopy (EELS)