Available
Scanning Transmission Electron Microscope (STEM) | JEOL JEM-2100F Field-Emission STEM
JEOL JEM-2100F Field-Emission STEM
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Commercial Rate
Capabilities
- ✓High brightness Schottky field emitter
- ✓Resolution: 0.23 nm point-to-point, 0.1 nm lattice; high-resolution pole piece
- ✓Bright field (BF), dark field (DF), and high-angle annular dark-field (HAADF) detectors
- ✓High resolution lattice imaging (HRTEM)
- ✓Bruker SDD Energy Dispersive X-ray Spectroscopy (EDXS) system
- ✓Gatan Tridiem electron energy imaging filter (GIF) system for Electron Energy Loss Spectroscopy (EELS)
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