EscaLab 250Xi

Key Functionalities •High resolution, quantitative surface spectroscopy providing elemental and chemical state information •Spatially-resolved, surface-specific elemental and chemical state mapping •High resolution depth profiling, including molecular profiling •High spectral resolution characterization of electronic structure •Advanced sample handling capabilities for transfer/characterization of air- and moisture-sensitive samples Key Configuration Parameters •Parallel imaging XPS, <3um spatial resolution •Monochromated Al K-alpha and non-monochromated dual anode (Mg/Ag) X-ray sources •Ultraviolet photoelectron spectroscopy (UPS) •Dual mode Argon mono/cluster ion source for profiling/cleaning of soft and hard materials •Charge compensation •High spectral resolution Auger electron spectroscopy (AES) •Sample preparation and modification chamber equipped with sample heating, gas dosing •Supplementary characterization chamber for temperature-programmed desorption, prepared for inverse photoemission spectroscopy •Sample heating/cooling (during characterization) and in transfer/preparation chambers •Integrated high-purity (<1ppm oxygen and moisture) Argon glovebox for sample loading •Sample transfer device for controlled-environment transfer of samples