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Optical Profiling System
Wyko NT2000 (2025)
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Sample Characterization Equipment. Training Estimates: 4 Hours. Surface heights measurement. Phase-shifting interferometry (PSI) mode allows measuring fairly smooth and continuous surfaces (0.1 nm < heights < 160 nm). Vertical scanning interferometry (VSI) mode measures rough surfaces and heights ranging between 160 nm and 2 mm. Include Sample Description and Analysis Requirements in note section of Order Form.
Capabilities
- ✓Surface height measurement
- ✓Phase-shifting interferometry
- ✓Vertical scanning interferometry
- ✓0.1 nm to 2 mm range
- ✓Smooth surface analysis
- ✓Rough surface analysis
- ✓3D surface profiling
- ✓Non-contact measurement
Specifications
| manufacturer | Wyko |
| model | NT2000 |
| psi range | 0.1 nm to 160 nm |
| vsi range | 160 nm to 2 mm |
| modes | PSI and VSI |
| training time | 4 hours |
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