Available
Atomic Force Microscope (AFM)
Bruker Dimension FastScan
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Commercial Rate
The Bruker Dimension FastScan AFM provides high speed topographic imaging without loss of resolution or force control. The system is capable of measurements on both large and small size samples in air or fluids. The FastScan module generates on the fly atomic force microscopy images.
Capabilities
- ✓ScanAsyst
- ✓Nanomechanical Mapping
- ✓TappingMode (air and fluid)
- ✓Phase Imaging
- ✓Contact
- ✓Lateral Force
- ✓Lift
- ✓MFM
- ✓EFM
- ✓Force Spectroscopy
- ✓Force Volume
- ✓PeakForce TUNA mode
- ✓PeakForce KPFM mode
