Film Stress Measurement System
Available

Film Stress Measurement System

Toho Flexus (2025)

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Commercial Rate

Note: all equipment is reserved in increments of 30min. The Clean Room Entrance Fee is required in addition to the hourly rate. Please book both the tool and the 'Clean Room Entrance'. System for measuring film stress through substrate curvature analysis.

Capabilities

  • Film stress measurement
  • Mechanical property analysis
  • Substrate curvature measurement
  • Thin film characterization
  • Stress analysis
  • Clean room operation
  • 30 minute increments
  • Precision measurement

Specifications

manufacturerToho
modelFlexus
measurementFilm stress
reservation30 minute increments
additional feeClean Room Entrance Fee required