4155c Semiconductor Parameter Analyzer (Agilent), used with Lake Shore and custom probe station

Agilent 4155C is an electronic instrument for measuring and analyzing the characteristics of semiconductor devices. This instrument allows you to perform both measurement and analysis of measurement results. The 4155C has four highly accurate source monitor units (SMUs), two voltage source units (VSUs), and two voltage measurement units (VMUs). It can perform three types of measurements: sweep measurement, sampling measurement, and quasi-static C-V measurement. C-V Measurement. Capacitance is calculated value derived from the equation: C=dQ/dV.