Scanning Electron Microscopes (SEM)

Scanning Electron Microscopy (SEM) is a powerful imaging technique widely used in materials science, biology, and engineering. It uses a focused beam of electrons to scan the surface of a sample, producing detailed images with exceptional depth of field. This technique allows for the examination of microstructures and surface features at magnifications up to several hundred thousand times. SEM is invaluable for analyzing the morphology, composition, and topography of materials.