ThermoFisher Helios G4 UX DualBeam for Materials Science

Fastest and easiest preparation of the highest quality samples for HR S/TEM and APT Features: High quality ultra-thin TEM sample preparation: automated sample preparation using AutoTEM allows multiple lamella preparation for final polishing. Low-energy (>500 eV) final polishing: minimizes sample damage for high quality TEM lamellas. Slice and view: automated sequential mill and view to collect series of slices images. Allow sample 3D reconstruction for further analysis such as 3D segmentation. EDS: allows simultaneous EDS mapping for 3D reconstruction EBSD: provides grain orientation maps, grain boundary maps, phase maps and pole figures. FIB patterning: creates small structures with feature size down to tens of nanometers via 3D ion milling and deposition. E-beam lithography: e-beam writing on resist coated surface for device fabrication with feature size smaller than 10 nm.