microscopy
JEOL JCM-6000Plus NeoScope Scanning Electron Microscope
By JEOL - JCM-6000Plus NeoScope (2025)
Oklahoma Center for Adult Stem Cell Research
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Latest benchtop SEM technology with touch panel control. High-sensitivity semiconductor detectors for composition contrast and efficient analysis. High-vacuum functionality and secondary electron detector for fine structure observation at high magnification. Automatic image formation in 3 minutes, 60,000X resolution, multi-touch interface, automatic focus/stigmation/brightness/contrast.
Min. Booking: 1 hours
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Enterprise or contract research?