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Asylum Research MFP-3D AFM

By Asylum Research

University of Illinois Urbana-Champaign
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These two AFMs from Asylum Research feature closed-loop, low noise, high precision scanners, with Q-controlled AC modes (with phase imaging), piezo response imaging, contact mode with lateral force, and detailed force-distance measurements. These systems allow scanning in air or liquid environments, and have extensive nanomanipulation and nanolithography capabilities. Maximum lateral scan size on these instruments is 90 µm x 90 µm, and maximum vertical range is 15 µm. In addition to modes requiring no additional hardware, the MFP-3D-SA instruments have the following accessories and upgrades:

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