Fischione NanoMill 1040

Imaging & Analysis Facility Use This ultra-low-energy, concentrated ion beam is used to remove near-surface damage and carbon contamination from TEM specimens. Its high precision argon ion beam is capable of post-FIB (focused ion beam) processing and conventional specimen preparation. High precision Ar Ion mill for TEM sample prepartaion. Laboratory for Integrated Science and Engineering © 2025 Harvard CNS. All rights reserved. Center for Nanoscale Systems *